??
標準編號: IEC 60749-11-2002
中文標準名稱: 半導體器件.機械和氣候試驗方法.第11部分: 溫度的急速變化.雙液電鍍槽法
代替標準號: IEC 47/1535A/CDV-2000;IEC 47/1605/FDIS-2002;IEC 60749-1996;IEC 60749 AMD 1-2000;IEC 60749 AMD 2-2001;IEC 60749 Edition 2.2-2002;IEC/PAS 62185-2000,
標準簡介:
defines the rapid change of temperature test method and the two-fluid-bath method. this test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. this test is applicable to all semiconductor devices. it is considered destructive unless otherwise detailed in the relevant specification.
中國標準分類號: L40
